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ICCAD
2009
IEEE
151views Hardware» more  ICCAD 2009»
13 years 3 months ago
Timing yield-aware color reassignment and detailed placement perturbation for double patterning lithography
Double patterning lithography (DPL) is a likely resolution enhancement technique for IC production in 32nm and below technology nodes. However, DPL gives rise to two independent, ...
Mohit Gupta, Kwangok Jeong, Andrew B. Kahng
ICDM
2009
IEEE
162views Data Mining» more  ICDM 2009»
13 years 3 months ago
The Flexible Climate Data Analysis Tools (CDAT) for Multi-model Climate Simulation Data
Being able to incorporate, inspect, and analyze data with newly developed technologies, diagnostics, and visualizations in an easy and flexible way has been a longstanding challen...
Dean N. Williams, Charles M. Doutriaux, Robert S. ...
IEEEPACT
2009
IEEE
13 years 3 months ago
Cache Sharing Management for Performance Fairness in Chip Multiprocessors
Resource sharing can cause unfair and unpredictable performance of concurrently executing applications in Chip-Multiprocessors (CMP). The shared last-level cache is one of the mos...
Xing Zhou, Wenguang Chen, Weimin Zheng
COMGEO
2010
ACM
13 years 3 months ago
A new paradigm for integrated environmental monitoring
The vision of an integrated Earth observation system to help protect and sustain the planet and its inhabitants is significant and timely, and thus has been identified recently by...
Kevin Montgomery, Carsten W. Mundt
BCB
2010
156views Bioinformatics» more  BCB 2010»
13 years 23 days ago
RepFrag: a graph based method for finding repeats and transposons from fragmented genomes
Growing sequencing and assembly efforts have been met by the advances in high throughput machines. However, the presence of massive amounts of repeats and transposons complicates ...
Nirmalya Bandyopadhyay, A. Mark Settles, Tamer Kah...
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