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GLVLSI
2002
IEEE
118views VLSI» more  GLVLSI 2002»
13 years 10 months ago
Novel interconnect modeling by using high-order compact finite difference methods
— The high-order compact finite difference (HCFD) method is adapted for interconnect modeling. Based on the compact finite difference method, the HCFD method employs the Chebys...
Qinwei Xu, Pinaki Mazumder
ICCAD
2004
IEEE
88views Hardware» more  ICCAD 2004»
14 years 2 months ago
Interconnect lifetime prediction under dynamic stress for reliability-aware design
Thermal effects are becoming a limiting factor in highperformance circuit design due to the strong temperaturedependence of leakage power, circuit performance, IC package cost and...
Zhijian Lu, Wei Huang, John Lach, Mircea R. Stan, ...
VLSID
2000
IEEE
102views VLSI» more  VLSID 2000»
13 years 9 months ago
Inductance Characterization of Small Interconnects Using Test-Signal Method
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
Jeegar Tilak Shah, Madhav P. Desai, Sugata Sanyal
ISCA
2003
IEEE
168views Hardware» more  ISCA 2003»
13 years 10 months ago
Temperature-Aware Microarchitecture
With power density and hence cooling costs rising exponentially, processor packaging can no longer be designed for the worst case, and there is an urgent need for runtime processo...
Kevin Skadron, Mircea R. Stan, Wei Huang, Sivakuma...
ASPDAC
2008
ACM
106views Hardware» more  ASPDAC 2008»
13 years 7 months ago
Hierarchical Krylov subspace reduced order modeling of large RLC circuits
In this paper, we propose a new model order reduction approach for large interconnect circuits using hierarchical decomposition and Krylov subspace projection-based model order re...
Duo Li, Sheldon X.-D. Tan