— The high-order compact finite difference (HCFD) method is adapted for interconnect modeling. Based on the compact finite difference method, the HCFD method employs the Chebys...
Thermal effects are becoming a limiting factor in highperformance circuit design due to the strong temperaturedependence of leakage power, circuit performance, IC package cost and...
Zhijian Lu, Wei Huang, John Lach, Mircea R. Stan, ...
The test signal method can be used to measure and model inductance parameters (self and mutual) of a very small interconnect especially in highdensity IC’s by using a test signa...
With power density and hence cooling costs rising exponentially, processor packaging can no longer be designed for the worst case, and there is an urgent need for runtime processo...
Kevin Skadron, Mircea R. Stan, Wei Huang, Sivakuma...
In this paper, we propose a new model order reduction approach for large interconnect circuits using hierarchical decomposition and Krylov subspace projection-based model order re...