139 search results - page 2 / 28 » An evolutionary algorithm for reducing integrated-circuit te... |
EVOW
2003
Springer
13 years 10 months ago
2003
Springer
Evolutionary Algorithms (EAs) have been proposed as a very powerful heuristic optimization technique to solve complex problems. Many case studies have shown that they work very eff...
KDD
2000
ACM
13 years 9 months ago
2000
ACM
We describe an application of data mining and decision analysis to the problem of die-level functional test in integrated circuit manufacturing. Integrated circuits are fabricated...
DAC
2007
ACM
14 years 6 months ago
2007
ACM
The test time for core-external interconnect shorts/opens is typically much less than that for core-internal logic. Therefore, prior work on test infrastructure design for core-ba...
GECCO
2004
Springer
13 years 10 months ago
2004
Springer
Abstract. In many real-world applications of evolutionary computation, it is essential to reduce the number of fitness evaluations. To this end, computationally efficient models c...
ASIAMS
2009
IEEE
13 years 10 months ago
2009
IEEE
—Reduced ordered binary decision diagram (ROBDD) is a memory-efficient data structure which is used in many applications such as synthesis, digital system, verification, testing ...