65 search results - page 12 / 13 » An on Chip ADC Test Structure |
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
Power distribution and signal transmission are becoming key limiters for chip performance in nanometer era. These issues can be simultaneously addressed by designing transmission ...
IJSNET
2008
13 years 5 months ago
2008
: The IEEE 802.15.4 and Zigbee are protocols aimed at low-duty and low-power wireless sensor networks. Continuously monitoring applications such as applications of structural healt...
IOLTS
2008
IEEE
14 years 1 days ago
2008
IEEE
— Error correcting coding is the dominant technique to achieve acceptable soft-error rates in memory arrays. In many modern circuits, the number of memory elements in the random ...
CIS
2005
Springer
13 years 11 months ago
2005
Springer
⎯A new nonslicing floorplan representation, the moving block sequence (MBS), is proposed in this paper. Our idea of the MBS originates from the observation that placing blocks on...
ISCA
2008
IEEE
14 years 1 days ago
2008
IEEE
As CMOS technology scales and more transistors are packed on to the same chip, soft error reliability has become an increasingly important design issue for processors. Prior resea...