2 search results - page 1 / 1 » An unexpected factor in testing for CMOS opens: the die surf... |
VTS
1996
IEEE
13 years 9 months ago
1996
IEEE
In this paper, we for the rst time present experimental evidence that the die surface can act as an RC interconnect, becoming an important factor in determining the voltage of a o...
ICCAD
1997
IEEE
13 years 9 months ago
1997
IEEE
We describe a highly accurate but e cient fault simulator for interconnect opens, based on characterizing the standard cell library with SPICE; using transistor charge equations f...