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VTS   1996 IEEE VLSI Test Symposium
Wall of Fame | Most Viewed VTS-1996 Paper
VTS
1996
IEEE
126views Hardware» more  VTS 1996»
13 years 9 months ago
Automatic test generation using genetically-engineered distinguishing sequences
A fault-oriented sequential circuit test generator is described in which various types of distinguishing sequences are derived, both statically and dynamically, to aid the test ge...
Michael S. Hsiao, Elizabeth M. Rudnick, Janak H. P...
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