135 search results - page 2 / 27 » Analog circuit test based on a digital signature |
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
This paper presents an algorithm based on testability measurement for test point insertion of mixed-signal circuits. Two transfer function models compatible with analog models are...
CORR
2011
Springer
13 years 10 days ago
2011
Springer
This paper investigates the impact of the changes of the characteristic polynomials and initial loadings, on behaviour of aliasing errors of parallel signature analyzer (Multi-Inp...
ISCAS
2005
IEEE
13 years 11 months ago
2005
IEEE
—We present a Built-In Self-Test (BIST) approach based on direct digital synthesizer (DDS) for functionality testing of analog circuitry in mixed-signal systems. DDS with Delta-S...
KES
1998
Springer
13 years 9 months ago
1998
Springer
The architectural and circuit design aspects of a mixed analog/digital very large scale integration (VLSI) motion detection chip based on models of the insect visual system are des...
DAC
1998
ACM
13 years 9 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...