13 search results - page 2 / 3 » Analysis of Performance Impact Caused by Power Supply Noise ... |
IOLTS
2006
IEEE
13 years 11 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...
ICCAD
2001
IEEE
14 years 1 months ago
2001
IEEE
— Modern sub-micron VLSI designs include huge power grids that are required to distribute large amounts of current, at increasingly lower voltages. The resulting voltage drop on ...
ICCAD
2003
IEEE
14 years 1 months ago
2003
IEEE
Transient Signal Analysis (TSA) is a parametric device testing technique based on the analysis of dynamic (transient) current (iDDT) drawn by the core logic from the power supply ...
IOLTS
2003
IEEE
13 years 10 months ago
2003
IEEE
On-chip global interconnections in very deep submicron technology (VDSM) ICs are becoming more sensitive and prone to errors caused by power supply noise, crosstalk noise, delay v...
DAC
2009
ACM
14 years 5 months ago
2009
ACM
Embedded cryptosystems show increased vulnerabilities to implementation attacks such as power analysis. CMOS technology trends are causing increased process variations which impac...