9 search results - page 2 / 2 » Analysis of Power Switching Losses Accounting Probe Modeling |
TCAD
2008
13 years 4 months ago
2008
Manufacturing process variations lead to variability in circuit delay and, if not accounted for, can cause excessive timing yield loss. The familiar traditional approaches to timin...
CORR
2010
Springer
13 years 5 months ago
2010
Springer
We consider wireless networks that can be modeled by multiple access channels in which all the terminals are equipped with multiple antennas. The propagation model used to account...
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
—Test application at reduced power supply voltage (low-voltage testing) or reduced temperature (low-temperature testing) can improve the defect coverage of a test set, particular...
BIOINFORMATICS
2010
13 years 5 months ago
2010
DNA copy number variants (CNV) are gains and losses of segments of chromosomes, and comprise an important class of genetic variation. Recently, various microarray hybridization ba...