10 search results - page 2 / 2 » Analysis of interconnect crosstalk defect coverage of test s... |
DATE
2004
IEEE
13 years 9 months ago
2004
IEEE
Due to process variations in deep sub-micron (DSM) technologies, the effects of timing defects are difficult to capture. This paper presents a novel coverage metric for estimating...
DATE
2002
IEEE
13 years 11 months ago
2002
IEEE
We present a new test resource partitioning (TRP) technique for reduced pin-count testing of system-on-a-chip (SOC). The proposed technique is based on test data compression and o...
UML
2004
Springer
13 years 11 months ago
2004
Springer
We describe the tools and interfaces created by the AGEDIS project, a European Commission sponsored project for the creation of a methodology and tools for automated model driven ...
SIGADA
2001
Springer
13 years 10 months ago
2001
Springer
Automatic software testing is gradually becoming accepted practice in the software industry. The shrinking development cycle and higher expectation of software quality are forcing...
ICST
2010
IEEE
13 years 4 months ago
2010
IEEE
—Mutation testing measures the adequacy of a test suite by seeding artificial defects (mutations) into a program. If a test suite fails to detect a mutation, it may also fail to...