14 search results - page 3 / 3 » Approximate logic circuits for low overhead, non-intrusive c... |
VLSID
2003
IEEE
14 years 5 months ago
2003
IEEE
We propose a non-intrusive methodology for concurrent fault detection in FSMs. The proposed method is similar to duplication, wherein a replica of the circuit acts as a predictor ...
DATE
2009
IEEE
13 years 12 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
IOLTS
2002
IEEE
13 years 10 months ago
2002
IEEE
The reusing of the same hardware resources to implement speed-critical algorithms, without interrupting system operation, is one of the main reasons for the increasing use of reco...
TDSC
2010
13 years 3 months ago
2010
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...