24 search results - page 2 / 5 » Arbitrary Error Detection in Combinational Circuits by Using... |
DATE
2009
IEEE
13 years 11 months ago
2009
IEEE
Soft errors in combinational and sequential elements of digital circuits are an increasing concern as a result of technology scaling. Several techniques for gate and latch hardeni...
HASE
2008
IEEE
13 years 5 months ago
2008
IEEE
In this paper, we propose a randomization based technique to verify whether a manufactured chip conforms to its design or is infected by any trojan circuit. A trojan circuit can be...
ICCD
2006
IEEE
14 years 1 months ago
2006
IEEE
— We have entered an era where chip yields are decreasing with scaling. A new concept called intelligible testing has been previously proposed with the goal of reversing this tre...
DATE
2008
IEEE
13 years 11 months ago
2008
IEEE
The importance of testing approaches that exploit error tolerance to improve yield has previously been established. Error rate, defined as the percentage of vectors for which the...
IOLTS
2006
IEEE
13 years 10 months ago
2006
IEEE
So far, performance and reliability of circuits have been determined by worst-case characterization of silicon and environmental noise. As new deep sub-micron technologies exacerb...