24 search results - page 3 / 5 » Arbitrary Error Detection in Combinational Circuits by Using... |
ITC
2000
IEEE
13 years 10 months ago
2000
IEEE
Concurrent error detection (CED) techniques (based on hardware duplication, parity codes, etc.) are widely used to enhance system dependability. All CED techniques introduce some ...
TVLSI
2008
13 years 5 months ago
2008
Exact approaches to combinational equivalence checking, such as automatic test pattern generation-based, binary decision diagrams (BDD)-based, satisfiability-based, and hybrid appr...
DSD
2010
IEEE
13 years 4 months ago
2010
IEEE
— A method how to improve the coverage of single faults in combinational circuits is proposed. The method is based on Concurrent Error Detection, but uses a fault simulation to f...
ISQED
2010
IEEE
13 years 7 months ago
2010
IEEE
Recent studies have shown that an attacker can retrieve confidential information from cryptographic hardware (e.g. the secret key) by introducing internal faults. A secure and re...
HPCA
2006
IEEE
14 years 6 months ago
2006
IEEE
As silicon technologies move into the nanometer regime, transistor reliability is expected to wane as devices become subject to extreme process variation, particle-induced transie...