8 search results - page 1 / 2 » Arbitrary Two-Pattern Delay Testing Using a Low-Overhead Sup... |
ET
2008
13 years 5 months ago
2008
DATE
2005
IEEE
13 years 11 months ago
2005
IEEE
— With increasing process fluctuations in nano-scale technology, testing for delay faults is becoming essential in manufacturing test to complement stuck-at-fault testing. Desig...
DFT
2004
IEEE
13 years 9 months ago
2004
IEEE
This paper presents a novel delay fault testing technique, which can be used as an alternative to the enhanced scan based delay fault testing, with significantly less design overh...
VTS
1998
IEEE
13 years 9 months ago
1998
IEEE
This paper presents simulation evidence supporting the use of bit transition maximization techniques in the design of hardware test pattern generators TPGs. Bit transition maximiz...
ICCD
2004
IEEE
14 years 2 months ago
2004
IEEE
— Reduction in test power is important to improve battery life in portable devices employing periodic self-test, to increase reliability of testing and to reduce test-cost. In sc...