5 search results - page 1 / 1 » Asymptotic probability extraction for non-normal distributio... |
ICCAD
2004
IEEE
14 years 1 months ago
2004
IEEE
While process variations are becoming more significant with each new IC technology generation, they are often modeled via linear regression models so that the resulting performanc...
SIGMOD
2012
ACM
11 years 7 months ago
2012
ACM
While extensive work has been done on evaluating queries over tuple-independent probabilistic databases, query evaluation over correlated data has received much less attention eve...
FTEDA
2006
13 years 4 months ago
2006
As IC technologies scale to finer feature sizes, it becomes increasingly difficult to control the relative process variations. The increasing fluctuations in manufacturing process...
ISPD
2003
ACM
13 years 10 months ago
2003
ACM
: Recent years have seen significant research in finding closed form expressions for the delay of an RC circuit that improves upon the Elmore delay model. However, several of these...