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DAC
1997
ACM
13 years 9 months ago
Automatic Generation of Synchronous Test Patterns for Asynchronous Circuits
This paper presents a novel approach for automatic test pattern generation of asynchronous circuits. The techniques used for this purpose assume that the circuit can only be exerc...
Oriol Roig, Jordi Cortadella, Marco A. Peña...
ICSEA
2006
IEEE
13 years 11 months ago
Testing a Network by Inferring Representative State Machines from Network Traces
— This paper describes an innovative approach to network testing based on automatically generating and analyzing state machine models of network behavior. The models are generate...
Nancy D. Griffeth, Yuri Cantor, Constantinos Djouv...
ICST
2009
IEEE
13 years 12 months ago
Test Input Generation Using UML Sequence and State Machines Models
We propose a novel testing approach that combines information from UML sequence models and state machine models. Current approaches that rely solely on sequence models do not cons...
Aritra Bandyopadhyay, Sudipto Ghosh
ICSEA
2007
IEEE
13 years 11 months ago
Test Data Generation from UML State Machine Diagrams using GAs
Automatic test data generation helps testers to validate software against user requirements more easily. Test data can be generated from many sources; for example, experience of t...
Chartchai Doungsa-ard, Keshav P. Dahal, M. Alamgir...
ERLANG
2003
ACM
13 years 10 months ago
Automated test generation for industrial Erlang applications
We present an implemented technique for generating test cases from state machine specifications. The work is motivated by a need for testing of protocols and services developed b...
Johan Blom, Bengt Jonsson