Sciweavers

117 search results - page 3 / 24
» Automated path generation for software fault localization
Sort
View
KBSE
2007
IEEE
14 years 1 days ago
Context-aware statistical debugging: from bug predictors to faulty control flow paths
Effective bug localization is important for realizing automated debugging. One attractive approach is to apply statistical techniques on a collection of evaluation profiles of pr...
Lingxiao Jiang, Zhendong Su
DATE
1999
IEEE
111views Hardware» more  DATE 1999»
13 years 10 months ago
Sequential Circuit Test Generation Using Decision Diagram Models
A novel approach to testing sequential circuits that uses multi-level decision diagram representations is introduced. The proposed algorithm consists of a combination of scanning ...
Jaan Raik, Raimund Ubar
ISSTA
2010
ACM
13 years 9 months ago
Automated fixing of programs with contracts
In program debugging, finding a failing run is only the first step; what about correcting the fault? Can we automate the second task as well as the first? The AutoFix-E tool au...
Yi Wei, Yu Pei, Carlo A. Furia, Lucas S. Silva, St...
ISSRE
2008
IEEE
14 years 4 days ago
Automated Generation of Pointcut Mutants for Testing Pointcuts in AspectJ Programs
Aspect-Oriented Programming (AOP) provides new modularization of software systems by encapsulating crosscutting concerns. AspectJ, an AOP language, uses abstractions such as point...
Prasanth Anbalagan, Tao Xie
ET
2000
145views more  ET 2000»
13 years 5 months ago
Fast Test Pattern Generation for Sequential Circuits Using Decision Diagram Representations
The paper presents a novel hierarchical approach to test pattern generation for sequential circuits based on an input model of mixed-level decision diagrams. A method that handles,...
Jaan Raik, Raimund Ubar