14 search results - page 2 / 3 » Automatic control flow based generation of stubs for structu... |
APLAS
2006
ACM
13 years 11 months ago
2006
ACM
This paper tackles a problem often overlooked in functional programming community: that of testing. Fully automatic test tools like Quickcheck and G∀ST can test first order func...
TVLSI
2008
13 years 5 months ago
2008
We present a Mutation-based Validation Paradigm (MVP) technology that can handle complete high-level microprocessor implementations and is based on explicit design error modeling, ...
VLSID
2004
IEEE
14 years 6 months ago
2004
IEEE
Recent research for testable designs has focussed on inserting test structures by re-arranging an Register-TransferLevel (RTL) data path generated from a behavioural description t...
SIGIR
2004
ACM
13 years 11 months ago
2004
ACM
Although text categorization is a burgeoning area of IR research, readily available test collections in this field are surprisingly scarce. We describe a methodology and system (...
FCCM
2006
IEEE
13 years 11 months ago
2006
IEEE
Current Radio Frequency Identification (RFID) systems generally have long design times and low tolerance to changes in specification. This paper describes a field programmable,...