15 search results - page 1 / 3 » Blackbox Polynomial Identity Testing for Depth 3 Circuits |
FOCS
2009
IEEE
13 years 11 months ago
2009
IEEE
COCO
2009
Springer
13 years 11 months ago
2009
Springer
—We show that the rank of a depth-3 circuit (over any field) that is simple, minimal and zero is at most O(k3 log d). The previous best rank bound known was 2O(k2 ) (log d)k−2...
CORR
2010
Springer
12 years 11 months ago
2010
Springer
STOC
2005
ACM
14 years 5 months ago
2005
ACM
In this work we study two, seemingly unrelated, notions. Locally Decodable Codes (LDCs) are codes that allow the recovery of each message bit from a constant number of entries of ...
COCO
2006
Springer
13 years 6 months ago
2006
Springer
We study the identity testing problem for depth 3 arithmetic circuits ( circuit). We give the first deterministic polynomial time identity test for circuits with bounded top fanin...