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INTEGRATION
2008
94views more  INTEGRATION 2008»
13 years 5 months ago
Variability in nanometer CMOS: Impact, analysis, and minimization
Variation is a significant concern in nanometer-scale CMOS due to manufacturing equipment being pushed to fundamental limits, particularly in lithography. In this paper, we review...
Dennis Sylvester, Kanak Agarwal, Saumil Shah
DAC
2005
ACM
13 years 7 months ago
Variation-tolerant circuits: circuit solutions and techniques
Die-to-die and within-die variations impact the frequency and power of fabricated dies, affecting functionality, performance, and revenue. Variation-tolerant circuits and post-sil...
James Tschanz, Keith A. Bowman, Vivek De
SIGOPSE
1994
ACM
13 years 9 months ago
New Directions for Integrated Circuit Cards Operating Systems
Integrated circuit cards or smart cards are now well-known. Applications such as electronic purses (cash units stored in cards), subscriber identification cards used in cellular te...
Pierre Paradinas, Jean-Jacques Vandewalle
DFT
2008
IEEE
182views VLSI» more  DFT 2008»
13 years 7 months ago
Hardware Trojan Detection and Isolation Using Current Integration and Localized Current Analysis
This paper addresses a new threat to the security of integrated circuits (ICs). The migration of IC fabrication to untrusted foundries has made ICs vulnerable to malicious alterat...
Xiaoxiao Wang, Hassan Salmani, Mohammad Tehranipoo...
DAM
2007
100views more  DAM 2007»
13 years 5 months ago
Memory management optimization problems for integrated circuit simulators
In hardware design, it is necessary to simulate the anticipated behavior of the integrated circuit before it is actually cast in silicon. As simulation procedures are long due to ...
Timothée Bossart, Alix Munier Kordon, Franc...