8 search results - page 1 / 2 » Built-In Fault Injectors - The Logical Continuation of BIST |
WISES
2003
13 years 6 months ago
2003
— With the increasing number of embedded computer systems being used in safety critical applications the testing and assessment of a system’s fault tolerance properties become ...
DATE
2010
IEEE
13 years 9 months ago
2010
IEEE
Abstract—Built-In Self-Test (BIST) is less often applied to random logic than to embedded memories due to the following reasons: Firstly, for a satisfiable fault coverage it may...
MTDT
2000
IEEE
13 years 9 months ago
2000
IEEE
In this work, we present the application of Generalized Linear Feedback Shift Registers (GLFSRs) for generation of patterns for pseudo-random memory Built-In SelfTest (BIST). Rece...
IJCNN
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper shows an application in the field of Electronic CAD of the Selfish Gene algorithm, an evolutionary algorithm based on a recent interpretation of the Darwinian theory. Te...
CSREAESA
2009
13 years 5 months ago
2009
Two embedded processor based fault injection case studies are presented which are applicable to Field Programmable Gate Arrays (FPGAs) and FPGA cores in configurable System-on-Chip...