2 search results - page 1 / 1 » Built-In Reseeding for Serial Bist |
VTS
2003
IEEE
13 years 10 months ago
2003
IEEE
Reseeding is used to improve fault coverage in pseudo-random testing. Most of the work done on reseeding is based on storing the seeds in an external tester. Besides its high cost...
GLVLSI
2003
IEEE
13 years 10 months ago
2003
IEEE
In this paper a novel reseeding architecture for scan-based BIST, which uses an LFSR as TPG, is proposed. Multiple cells of the LFSR are utilized as sources for feeding the scan c...