74 search results - page 15 / 15 » Built-in test generation for synchronous sequential circuits |
VTS
1999
IEEE
13 years 9 months ago
1999
IEEE
Sequential test generators fail to yield tests for some stuck-at-faults because they are unable to reach certain states necessary for exciting propagating these target faults. Add...
DAC
2000
ACM
14 years 6 months ago
2000
ACM
In this paper we describe an area efficient power minimization scheme "Control Generated ClockingI` that saves significant amounts of power in datapath registers and clock dr...
MEMOCODE
2007
IEEE
13 years 11 months ago
2007
IEEE
Due to the rapidly growing speed and the decreasing size of gates in modern chips, the probability of faults caused by the production process grows. Already small variations lead ...
EUROMICRO
2000
IEEE
13 years 9 months ago
2000
IEEE
The Automated Production Systems (APS) are composed of concurrent interacting entities. Then any model should exhibit parallel and sequential behaviours. The Grafcet is now well e...