Sciweavers

13 search results - page 1 / 3
» CAD computation for manufacturability: can we save VLSI tech...
Sort
View
VLSID
2004
IEEE
117views VLSI» more  VLSID 2004»
14 years 5 months ago
Evaluating the Reliability of Defect-Tolerant Architectures for Nanotechnology with Probabilistic Model Checking
As we move from deep submicron technology to nanotechnology for device manufacture, the need for defect-tolerant architectures is gaining importance. This is because, at the nanos...
Gethin Norman, David Parker, Marta Z. Kwiatkowska,...
VLSI
2010
Springer
13 years 3 months ago
Design of low-complexity and high-speed digital Finite Impulse Response filters
—In this paper, we introduce a design methodology to implement low-complexity and high-speed digital Finite Impulse Response (FIR) filters. Since FIR filters suffer from a larg...
Diego Jaccottet, Eduardo Costa, Levent Aksoy, Paul...
EVOW
2000
Springer
13 years 8 months ago
Prediction of Power Requirements for High-Speed Circuits
Modern VLSI design methodologies and manufacturing technologies are making circuits increasingly fast. The quest for higher circuit performance and integration density stems from f...
Fulvio Corno, Maurizio Rebaudengo, Matteo Sonza Re...
TVLSI
2008
126views more  TVLSI 2008»
13 years 4 months ago
Body Bias Voltage Computations for Process and Temperature Compensation
With continued scaling into the sub-90nm regime, the role of process, voltage and temperature (PVT) variations on the performance of VLSI circuits has become extremely important. T...
Sanjay V. Kumar, Chris H. Kim, Sachin S. Sapatneka...