34 search results - page 4 / 7 » Characterizing cloud computing hardware reliability |
BMCBI
2005
13 years 5 months ago
2005
Background: Expressed Sequence Tags (ESTs) are short and error-prone DNA sequences generated from the 5' and 3' ends of randomly selected cDNA clones. They provide an im...
ICCD
2007
IEEE
14 years 3 days ago
2007
IEEE
A methodology for constructing circuit-level mismatch models and performing yield optimization is presented for CMOS analog circuits. The methodology combines statistical techniqu...
ISSS
1996
IEEE
13 years 10 months ago
1996
IEEE
The application range of the embedded computing is going to cover the majority of the market products spanning from consumer electronic, automotive, telecom and process control. F...
ISLPED
2009
ACM
13 years 10 months ago
2009
ACM
In this paper, we propose a proactive dynamic thermal management scheme for chip multiprocessors that run multi-threaded workloads. We introduce a new predictor that utilizes the ...
DATE
2006
IEEE
13 years 12 months ago
2006
IEEE
— In this paper, we present an analysis methodology to compute circuit node sensitivity due to charged particle induced delay (timing) errors, Soft Delay Errors (SDE). We define...