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DATE
2003
IEEE
75views Hardware» more  DATE 2003»
13 years 10 months ago
Circuit and Platform Design Challenges in Technologies beyond 90nm
There are already a huge number of problems for silicon designers and it is likely to just get worse. Many of these problems are technical associated with shrinking geometries and...
Bill Grundmann, Rajesh Galivanche, Sandip Kundu
ICCAD
2002
IEEE
163views Hardware» more  ICCAD 2002»
14 years 1 months ago
Sub-90nm technologies: challenges and opportunities for CAD
Future high performance microprocessor design with technology scaling beyond 90nm will pose two major challenges: (1) energy and power, and (2) parameter variations. Design practi...
Tanay Karnik, Shekhar Borkar, Vivek De
DAC
2005
ACM
13 years 6 months ago
A design platform for 90-nm leakage reduction techniques
Methodology, EDA Flow, scripts, and documentation plays a tremendous role in the deployment and standardization of advanced design techniques. In this paper we focus not only on l...
Philippe Royannez, Hugh Mair, Franck Dahan, Mike W...
DAC
2003
ACM
14 years 5 months ago
Parameter variations and impact on circuits and microarchitecture
Parameter variation in scaled technologies beyond 90nm will pose a major challenge for design of future high performance microprocessors. In this paper, we discuss process, voltag...
Shekhar Borkar, Tanay Karnik, Siva Narendra, James...
ICCAD
2006
IEEE
99views Hardware» more  ICCAD 2006»
14 years 1 months ago
Variability and yield improvement: rules, models, and characterization
Yield and variability are becoming detractors for successful design in sub-90-nm process technologies. We consider the fundamental lithography and process issues that are driving ...
Kenneth L. Shepard, Daniel N. Maynard