54 search results - page 2 / 11 » Clustering based pruning for statistical criticality computa... |
ICCAD
2003
IEEE
13 years 11 months ago
2003
IEEE
Process variations have become a critical issue in performance verification of high-performance designs. We present a new, statistical timing analysis method that accounts for int...
DAC
2008
ACM
14 years 6 months ago
2008
ACM
The threshold voltage (Vth) of a nanoscale transistor is severely affected by random dopant fluctuations and line-edge roughness. The analysis of these effects usually requires at...
SDM
2008
SIAM
13 years 7 months ago
2008
SIAM
Graph data such as chemical compounds and XML documents are getting more common in many application domains. A main difficulty of graph data processing lies in the intrinsic high ...
DAC
2005
ACM
13 years 7 months ago
2005
ACM
A physical yet compact gate delay model is developed integrating short-channel effects and the Alpha-power law based timing model. This analytical approach accurately predicts bot...
CODES
2010
IEEE
13 years 3 months ago
2010
IEEE
The impact of process variation in state of the art technology makes traditional (worst case) designs unnecessarily pessimistic, which translates to suboptimal designs in terms of...