Grids have the potential to revolutionize computing by providing ubiquitous, on demand access to computational services and resources. However, grid systems are extremely large, c...
Alexandre Duarte, Francisco Vilar Brasileiro, Walf...
A gate level, automated fault diagnosis scheme is proposed for scan-based BIST designs. The proposed scheme utilizes both fault capturing scan chain information and failing test v...
In industrial manufacturing rigorous testing is used to ensure that the delivered products meet their specifications. Mechanical maladjustment or faults often show their presence t...
Automated diagnosis of errors detected during software testing can improve the efficiency of the debugging process, and can thus help to make software more reliable. In this pape...
Peter Zoeteweij, Rui Abreu, Rob Golsteijn, Arjan J...
Although a number of automatic tools have been developed to detect faults, much of the diagnosis is still being done manually. To help with the diagnostic tasks, we formally intro...