Dynamic-current based test techniques can potentially address the drawbacks of traditional and Iddq test methodologies. The quality of dynamic current based test is degraded by pr...
With increasing circuit complexity and reliability requirements, screening outlier chips is an increasingly important test challenge. This is especially true for IDDQ test due to ...
The innate verbosity of the Extensible Markup Language remains one of its main weaknesses, especially when large XML documents are concerned. This problem can be solved with the a...
Przemyslaw Skibinski, Szymon Grabowski, Jakub Swac...
Defect prevention is the most vital but habitually neglected facet of software quality assurance in any project. If functional at all stages of software development, it can condens...
Background: Many procedures for finding differentially expressed genes in microarray data are based on classical or modified t-statistics. Due to multiple testing considerations, ...
Elena Perelman, Alexander Ploner, Stefano Calza, Y...