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EMSOFT
2005
Springer
13 years 10 months ago
Compiler-guided register reliability improvement against soft errors
With the scaling of technology, transient errors caused by external particle strikes have become a critical challenge for microprocessor design. As embedded processors are widely ...
Jun Yan, Wei Zhang
DSN
2006
IEEE
13 years 11 months ago
In-Register Duplication: Exploiting Narrow-Width Value for Improving Register File Reliability
Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to sof...
Jie Hu, Shuai Wang, Sotirios G. Ziavras
DAC
2009
ACM
14 years 6 months ago
Improving testability and soft-error resilience through retiming
State elements are increasingly vulnerable to soft errors due to their decreasing size, and the fact that latched errors cannot be completely eliminated by electrical or timing ma...
Smita Krishnaswamy, Igor L. Markov, John P. Hayes
DSN
2009
IEEE
13 years 11 months ago
Low overhead Soft Error Mitigation techniques for high-performance and aggressive systems
The threat of soft error induced system failure in high performance computing systems has become more prominent, as we adopt ultra-deep submicron process technologies. In this pap...
Naga Durga Prasad Avirneni, Viswanathan Subramania...
CSREAESA
2006
13 years 6 months ago
Improving the Fault Tolerance of a Computer System with Space-Time Triple Modular Redundancy
- Triple Modular Redundancy is widely used in dependable systems design to ensure high reliability against soft errors. Conventional TMR is effective in protecting sequential circu...
Wei Chen, Rui Gong, Fang Liu, Kui Dai, Zhiying Wan...