10 search results - page 2 / 2 » Compiler-guided register reliability improvement against sof... |
PRDC
2006
IEEE
13 years 11 months ago
2006
IEEE
As SRAM devices are scaled down, the number of variation-induced defective memory cells increases rapidly. Combination of ECC, particularly SECDED, with a redundancy technique can...
ICCAD
2007
IEEE
14 years 2 months ago
2007
IEEE
While circuit density and power efficiency increase with each major advance in IC technology, reliability with respect to soft errors tends to decrease. Current solutions to this...
DATE
2010
IEEE
13 years 10 months ago
2010
IEEE
—With the advancement of CMOS manufacturing process to nano-scale, future shipped microprocessors will be increasingly vulnerable to intermittent faults. Quantitatively character...
CGO
2009
IEEE
14 years 4 days ago
2009
IEEE
—As semiconductor technology scales into the deep submicron regime the occurrence of transient or soft errors will increase. This will require new approaches to error detection. ...
ICDCS
2005
IEEE
13 years 11 months ago
2005
IEEE
The process of computing the physical locations of nodes in a wireless sensor network is known as localization. Selflocalization is critical for large-scale sensor networks becaus...