80 search results - page 1 / 16 » Compressing Functional Tests for Microprocessors |
ATS
2005
IEEE
13 years 10 months ago
2005
IEEE
In the past, test data volume reduction techniques have concentrated heavily on scan test data content. However, functional vectors continue to be utilized because they target uni...
DCC
2008
IEEE
13 years 6 months ago
2008
IEEE
Researchers have proposed using hardware data compression units within the memory hierarchies of microprocessors in order to improve performance, energy efficiency, and functional...
ATS
2000
IEEE
13 years 9 months ago
2000
IEEE
TVLSI
2010
12 years 11 months ago
2010
Microprocessor designers have been torn between tight constraints on the amount of on-chip cache memory and the high latency of off-chip memory, such as dynamic random access memor...
DATE
2006
IEEE
13 years 11 months ago
2006
IEEE
We present an approach to prevent overtesting in scan-based delay test. The test data is transformed with respect to functional constraints while simultaneously keeping as many po...