9 search results - page 2 / 2 » Computation Error Analysis in Digital Signal Processing Syst... |
ISLPED
2007
ACM
13 years 6 months ago
2007
ACM
To address the productivity bottlenecks in power analysis and optimization of modern systems, we propose to treat power as a signal and leverage the rich set of signal processing ...
IOLTS
2007
IEEE
13 years 11 months ago
2007
IEEE
— Soft errors caused by ionizing radiation have emerged as a major concern for current generation of CMOS technologies and the trend is expected to get worse. A significant frac...
TC
2011
12 years 12 months ago
2011
—Mounting concerns over variability, defects and noise motivate a new approach for digital circuitry: stochastic logic, that is to say, logic that operates on probabilistic signa...
VLSID
2009
IEEE
14 years 5 months ago
2009
IEEE
: The challenges in nano-CMOS circuit design include the following: variability, leakage, power, thermals, reliability, and yield. This talk will focus on interdependent considerat...