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ISSRE
2006
IEEE
13 years 10 months ago
BPEL4WS Unit Testing: Test Case Generation Using a Concurrent Path Analysis Approach
BPEL is a language that could express complex concurrent behaviors. This paper presents a novel method of BPEL test case generation, which is based on concurrent path analysis. Th...
Jun Yan, Zhong Jie Li, Yuan Yuan, Wei Sun, Jian Zh...
ATS
2005
IEEE
132views Hardware» more  ATS 2005»
13 years 10 months ago
Concurrent Test Generation
We define a new type of test, called “concurrent test,” for a combinational circuit. Given a set of target faults, a concurrent-test is an input vector that detects all (or m...
Vishwani D. Agrawal, Alok S. Doshi
ENTCS
2006
113views more  ENTCS 2006»
13 years 4 months ago
Concurrent Java Test Generation as a Search Problem
A Random test generator generates executable tests together with their expected results. In the form of a noise-maker, it seeds the program with conditional scheduling primitives ...
Yaniv Eytani
PTS
2008
165views Hardware» more  PTS 2008»
13 years 6 months ago
Test Plan Generation for Concurrent Real-Time Systems Based on Zone Coverage Analysis
The state space explosion due to concurrency and timing constraints of concurrent real-time systems (CRTS) presents significant challenges to the verification engineers. In this pa...
Farn Wang, Geng-Dian Huang
ASWEC
2005
IEEE
13 years 10 months ago
A UML Approach to the Generation of Test Sequences for Java-Based Concurrent Systems
Starting with a UML specification that captures the underlying functionality of some given Java-based concurrent system, we describe a systematic way to construct, from this speci...
Soon-Kyeong Kim, Luke Wildman, Roger Duke