20 search results - page 1 / 4 » Correct Passive Testing Algorithms and Complete Fault Covera... |
FORTE
2003
13 years 6 months ago
2003
The aim of passive testing is to detect faults in a system while observing the system during normal operation, that is, without forcing the system to specialized inputs explicitly ...
DAC
1998
ACM
13 years 9 months ago
1998
ACM
This papers describes a new, fast and economical methodology to test linear analog circuits based on adaptive algorithms. To the authors knowledge, this is the first time such tec...
ETS
2009
IEEE
2009
IEEE
Increasing Robustness of SAT-based Delay Test Generation Using Efficient Dynamic Learning Techniques
13 years 2 months ago
Due to the increased speed in modern designs, testing for delay faults has become an important issue in the postproduction test of manufactured chips. A high fault coverage is nee...
AMOST
2005
ACM
13 years 10 months ago
2005
ACM
Interaction testing is widely used in screening for faults. In software testing, it provides a natural mechanism for testing systems to be deployed on a variety of hardware and so...
GLVLSI
2005
IEEE
13 years 10 months ago
2005
IEEE
We develop a novel on-line built-in self-test (BIST) technique for testing FPGAs that has a very high diagnosability even in presence of clustered faults, a fault pattern for whic...