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ASPDAC
2001
ACM
75views Hardware» more  ASPDAC 2001»
13 years 8 months ago
Correlation method of circuit-performance and technology fluctuations for improved design reliability
Abstract-- We propose a method of correlating circuit performance with technology fluctuations during the circuit-design phase. The method employs test circuits sensitive for techn...
D. Miyawaki, Shizunori Matsumoto, Hans Jürgen...
DAC
2007
ACM
13 years 9 months ago
Statistical Framework for Technology-Model-Product Co-Design and Convergence
This paper presents a statistical framework to cooperatively design and develop technology, product circuit, benchmarking and model early in the development stage. The statistical...
Choongyeun Cho, Daeik D. Kim, Jonghae Kim, Jean-Ol...
BMCBI
2010
103views more  BMCBI 2010»
13 years 5 months ago
Nonparametric methods for the analysis of single-color pathogen microarrays
Background: The analysis of oligonucleotide microarray data in pathogen surveillance and discovery is a challenging task. Target template concentration, nucleic acid integrity, an...
Omar J. Jabado, Sean Conlan, P. Lan Quan, Jeffrey ...