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DATE
2007
IEEE
106views Hardware» more  DATE 2007»
13 years 11 months ago
Low-cost protection for SER upsets and silicon defects
Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Mojtaba Mehrara, Mona Attariyan, Smitha Shyam, Kyp...
IEEEPACT
2006
IEEE
13 years 11 months ago
Self-checking instructions: reducing instruction redundancy for concurrent error detection
With reducing feature size, increasing chip capacity, and increasing clock speed, microprocessors are becoming increasingly susceptible to transient (soft) errors. Redundant multi...
Sumeet Kumar, Aneesh Aggarwal
ISCA
2007
IEEE
130views Hardware» more  ISCA 2007»
13 years 11 months ago
Dynamic prediction of architectural vulnerability from microarchitectural state
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
Kristen R. Walcott, Greg Humphreys, Sudhanva Gurum...
TDSC
2010
111views more  TDSC 2010»
13 years 3 months ago
Using Underutilized CPU Resources to Enhance Its Reliability
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
Avi Timor, Avi Mendelson, Yitzhak Birk, Neeraj Sur...
DSN
2006
IEEE
13 years 11 months ago
In-Register Duplication: Exploiting Narrow-Width Value for Improving Register File Reliability
Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to sof...
Jie Hu, Shuai Wang, Sotirios G. Ziavras