Extreme transistor scaling trends in silicon technology are soon to reach a point where manufactured systems will suffer from limited device reliability and severely reduced life...
Transient faults due to particle strikes are a key challenge in microprocessor design. Driven by exponentially increasing transistor counts, per-chip faults are a growing burden. ...
Kristen R. Walcott, Greg Humphreys, Sudhanva Gurum...
—Soft errors (or Transient faults) are temporary faults that arise in a circuit due to a variety of internal noise and external sources such as cosmic particle hits. Though soft ...
Avi Timor, Avi Mendelson, Yitzhak Birk, Neeraj Sur...
Protecting the register value and its data buses is crucial to reliable computing in high-performance microprocessors due to the increasing susceptibility of CMOS circuitry to sof...