46 search results - page 1 / 10 » Current Directions in Automatic Test-Pattern Generation |
COMPUTER
1999
13 years 4 months ago
1999
DATE
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper describes an efficient error simulator able to analyze functional VHDL descriptions. The proposed simulation environment can be based on commercial VHDL simulators. Al...
ASPDAC
2009
ACM
13 years 11 months ago
2009
ACM
Low power circuits have become a necessary part in modern designs. Retention flip-flop is one of the most important components in low power designs. Conventional test methodologie...
EUROPKI
2009
Springer
13 years 2 months ago
2009
Springer
Efficient zero-knowledge proofs of knowledge (ZK-PoK) are basic building blocks of many cryptographic applications such as identification schemes, group signatures, and secure mult...
SIAMJO
2002
13 years 4 months ago
2002
Motivated by some results for linear programs and complementarity problems, this paper gives some new characterizations of the central path conditions for semidefinite programs. Ex...