7 search results - page 1 / 2 » Current path analysis for electrostatic discharge protection |
ICCAD
2006
IEEE
14 years 1 months ago
2006
IEEE
The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer circuit design. High voltages resulted from ESD might cause high current densitie...
TCAD
2008
13 years 4 months ago
2008
Abstract--The electrostatic discharge (ESD) problem has become a challenging reliability issue in nanometer-circuit design. High voltages that resulted from ESD might cause high cu...
MR
2006
13 years 4 months ago
2006
The electrostatic discharge (ESD) robustness of different thin-film devices, including three diodes and two thin-film transistors (TFTs) in low-temperature polysilicon (LTPS) tech...
ISQED
2003
IEEE
13 years 10 months ago
2003
IEEE
To save layout area for electrostatic discharge (ESD) protection design in the SOC era, test chip with large size NMOS devices placed under bond pads has been fabricated in 0.35-...
IEEEARES
2008
IEEE
13 years 11 months ago
2008
IEEE
— Providing anonymity for end-users on the Internet is a very challenging and difficult task. There are currently only a few systems that are of practical relevance for the prov...