5 search results - page 1 / 1 » DEFUSE: A Deterministic Functional Self-Test Methodology for... |
VTS
2000
IEEE
13 years 9 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
DATE
2002
IEEE
13 years 9 months ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...
ITC
1998
IEEE
13 years 9 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
HPCA
2003
IEEE
14 years 5 months ago
2003
IEEE
With the scaling of technology and the need for higher performance and more functionality, power dissipation is becoming a major bottleneck for microprocessor designs. Pipeline ba...
DAC
1997
ACM
13 years 8 months ago
1997
ACM
Abstract. Many modern systems are designed as a set of interconnected reactive subsystems. The subsystem verification task is to verify an implementation of the subsystem against t...