5 search results - page 1 / 1 » DEFUSE: A Deterministic Functional Self-Test Methodology for... |
VTS
2000
IEEE
13 years 10 months ago
2000
IEEE
1 At-speed testing is becoming increasingly difficult with external testers as the speed of microprocessors approaches the GHz range. One solution to this problem is built-in self-...
DATE
2002
IEEE
13 years 10 months ago
2002
IEEE
Software self-testing for embedded processor cores based on their instruction set, is a topic of increasing interest since it provides an excellent test resource partitioning tech...
ITC
1998
IEEE
13 years 10 months ago
1998
IEEE
New methodologies based on functional testing and built-in self-test can narrow the gap between necessary solutions and existing techniques for processor validation and testing. W...
HPCA
2003
IEEE
14 years 6 months ago
2003
IEEE
With the scaling of technology and the need for higher performance and more functionality, power dissipation is becoming a major bottleneck for microprocessor designs. Pipeline ba...
DAC
1997
ACM
13 years 9 months ago
1997
ACM
Abstract. Many modern systems are designed as a set of interconnected reactive subsystems. The subsystem verification task is to verify an implementation of the subsystem against t...