39 search results - page 2 / 8 » DELTEST: Deterministic Test Generation for Gate-Delay Faults |
ETS
2006
IEEE
13 years 11 months ago
2006
IEEE
BIST is an attractive approach to detect delay faults due to its inherent support for at-speed test. Deterministic logic BIST (DLBIST) is a technique which was successfully applie...
ICCAD
2002
IEEE
14 years 2 months ago
2002
IEEE
This work presents several new techniques for enhancing the performance of deterministic test pattern generation for VLSI circuits. The techniques introduced are called dynamic de...
ICCAD
2000
IEEE
13 years 9 months ago
2000
IEEE
This paper presents new test generation techniques for improving the average-case performance of the iterative logic array based deterministic sequential circuit test generation a...
ATS
2009
IEEE
14 years 14 hour ago
2009
IEEE
—Measuring the steady state leakage current (IDDQ) is very successful in detecting faults not discovered by standard fault models. But vector dependencies of IDDQ decrease the re...
ISMVL
2005
IEEE
13 years 10 months ago
2005
IEEE
It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wi...