Test Generation and Fault Localization for Quantum Circuits

It is believed that quantum computing will begin to have a practical impact in industry around year 2010. We propose an approach to test generation and fault localization for a wide category of fault models. While in general we follow the methods used in test of standard circuits, there are two significant differences: (2) we use both deterministic and probabilistic tests to detect faults, (2) we use special measurement gates to determine the internal states. A Fault Table is created that includes probabilistic information. “Probabilistic set covering” and “probabilistic adaptive trees” that generalize those known in standard circuits, are next used.

• Type: Conference
• Year: 2005
• Where: ISMVL
• Authors: Marek A. Perkowski, Jacob Biamonte, Martin Lukac
• Keywords: Artificial Intelligence, ISMVL 2005, Probabilistic, Probabilistic Adaptive Trees, Standard Circuits