27 search results - page 1 / 6 » DRAM reliability |
DAC
2009
ACM
14 years 6 months ago
2009
ACM
In this paper, we compare embedded-DRAM (eDRAM) testing to both SRAM testing and commodity-DRAM testing, since an eDRAM macro uses DRAM cells with an SRAM interface. We first star...
CODES
2011
IEEE
12 years 5 months ago
2011
IEEE
Designing memory controllers for complex real-time and highperformance multi-processor systems-on-chip is challenging, since sufficient capacity and (real-time) performance must b...
ISCA
2012
IEEE
11 years 7 months ago
2012
IEEE
Memory system reliability is a serious and growing concern in modern servers. Existing chipkill-level memory protection mechanisms suffer from several drawbacks. They activate a l...
ASPLOS
2010
ACM
14 years 4 days ago
2010
ACM
DRAM is facing severe scalability challenges in sub-45nm technology nodes due to precise charge placement and sensing hurdles in deep-submicron geometries. Resistive memories, suc...
