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ESEM
2007
ACM
13 years 9 months ago
Defect Detection Efficiency: Test Case Based vs. Exploratory Testing
This paper presents a controlled experiment comparing the defect detection efficiency of exploratory testing (ET) and test case based testing (TCT). While traditional testing lite...
Juha Itkonen, Mika Mäntylä, Casper Lasse...
ISESE
2005
IEEE
13 years 10 months ago
Exploratory testing: a multiple case study
Exploratory testing (ET) – simultaneous learning, test design, and test execution – is an applied practice in industry but lacks research. We present the current knowledge of ...
Juha Itkonen, Kristian Rautiainen
ITC
2000
IEEE
93views Hardware» more  ITC 2000»
13 years 9 months ago
Stuck-fault tests vs. actual defects
This paper studies some manufacturing test data collected for an experimental digital IC. Test results for a large variety of single-stuck fault based test sets are shown and comp...
Edward J. McCluskey, Chao-Wen Tseng
CORR
2010
Springer
149views Education» more  CORR 2010»
13 years 5 months ago
Group Testing with Probabilistic Tests: Theory, Design and Application
Identification of defective members of large populations has been widely studied in the statistics community under the name of group testing. It involves grouping subsets of items...
Mahdi Cheraghchi, Ali Hormati, Amin Karbasi, Marti...
DATE
2009
IEEE
106views Hardware» more  DATE 2009»
13 years 12 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide hi...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty