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DATE
2009
IEEE

Generation of compact test sets with high defect coverage

9 years 9 months ago
Generation of compact test sets with high defect coverage
Abstract-Multi-detect (N-detect) testing suffers from the drawback that its test length grows linearly with N. We present a new method to generate compact test sets that provide high defect coverage. The proposed technique makes judicious use of a new pattern-quality metric based on the concept of output deviations. We select the most effective patterns from a large N-detect pattern repository, and guarantee a small test set as well as complete stuck-at coverage. Simulation results for benchmark circuits show that with a compact, 1-detect stuck-at test set, the proposed method provides considerably higher transition-fault coverage and coverage ramp-up compared to another recently-published method. Moreover, in all cases, the proposed method either outperforms or is as effective as the competing approach in terms of bridging-fault coverage and the surrogate BCE+ metric. In many cases, higher transition-fault coverage is obtained than much larger N-detect test sets for several values of ...
Xrysovalantis Kavousianos, Krishnendu Chakrabarty
Added 20 May 2010
Updated 20 May 2010
Type Conference
Year 2009
Where DATE
Authors Xrysovalantis Kavousianos, Krishnendu Chakrabarty
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