16 search results - page 3 / 4 » Defect detection using power supply transient signal analysi... |
CSE
2009
IEEE
14 years 16 days ago
2009
IEEE
Abstract—Today’s wirelessly networked embedded systems underlie a vast array of electronic devices, performing computation, communication, and input/output. A major design goal...
HUC
2010
Springer
13 years 6 months ago
2010
Springer
This paper presents ElectriSense, a new solution for automatically detecting and classifying the use of electronic devices in a home from a single point of sensing. ElectriSense r...
DAC
2003
ACM
14 years 6 months ago
2003
ACM
Interconnects have been shown to be a dominant source of energy consumption in modern day System-on-Chip (SoC) designs. With a large (and growing) number of electronic systems bei...
IPPS
2006
IEEE
13 years 11 months ago
2006
IEEE
The performance requirements for contemporary microprocessors are increasing as rapidly as their number of applications grows. By accelerating the clock, performance can be gained...
ICSE
2008
IEEE-ACM
14 years 6 months ago
2008
IEEE-ACM
Static analysis tools report software defects that may or may not be detected by other verification methods. Two challenges complicating the adoption of these tools are spurious f...