48 search results - page 10 / 10 » Defect tolerance for nanocomputer architecture |
DAC
2005
ACM
14 years 6 months ago
2005
ACM
As Si CMOS devices are scaled down into the nanoscale regime, current computer architecture approaches are reaching their practical limits. Future nano-architectures will confront...
DAC
2004
ACM
14 years 6 months ago
2004
ACM
We present novel and efficient methods for on-line testing in FPGAs. The testing approach uses a ROving TEster (ROTE), which has provable diagnosabilities and is also faster than ...
ISCA
2009
IEEE
14 years 11 days ago
2009
IEEE
Detecting data races in parallel programs is important for both software development and production-run diagnosis. Recently, there have been several proposals for hardware-assiste...