We describe a new method for design error diagnosis in digital circuits, that doesn’t use any error model. A diagnostic specific pre-analysis of the circuit extracts a subcircui...
This paper describes an approach to design error diagnosis and correction in combinational digital circuits. Our approach targets small errors introduced during the design process...
Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires ...
Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikara...
This paper describes a diagnosis technique for locating design errors in circuit implementations which do not match their functional specification. The method efficiently propagat...
Andreas Kuehlmann, David Ihsin Cheng, Arvind Srini...