Extraction Error Diagnosis and Correction in High-Performance Designs

Test model generation is crucial in the test generation process of a high-performance design targeted for large volume production. A key process in test model generation requires the extraction of a gate-level (logic) model from the transistor level representation of the circuit under test. Logic extraction is an error prone process due to extraction tool limitations and due to the human interference. Errors introduced by extraction require manual debugging, a resource intensive and time consuming task. This paper presents a set of extraction errors typical in an industrial environment. It also proposes an automated solution to extraction error diagnosis and correction. Experiments on circuits with similar architecture to that of high speed custom-made industrial blocks are conducted to confirm the fitness of the approach.

• Type: Conference
• Year: 2003
• Where: ITC
• Authors: Yu-Shen Yang, Jiang Brandon Liu, Paul J. Thadikaran, Andreas G. Veneris
• Keywords: Extraction Error, Hardware, ITC 2003, Test Generation Process, Test Model Generation